Home
List your patent
My account
Help
Support us
Classifying non-uniformities on the surface of a semiconductor
[Category : - ELECTRONICS]
[Viewed 1138 times]
A method and system for identifying and classifying non-uniformities on the surface of a semiconductor or in a semiconductor. The method and system involves scanning the wafer surface with a non-vibrating contact potential difference sensor to detect the locations of non-uniformities, extracting features characteristic of the non-uniformities, and applying a set of rules to these features to classify the type of each non-uniformity.
Asking price:
Make an offer
![](images/Patents-US/79/7900526.jpg)
[ Home
| List a patent
| Manage your account
| F.A.Q.|Terms of use
| Contact us]
Copyright PatentAuction.com 2004-2017
Page created at 2024-07-27 6:58:40, Patent Auction Time.